| Commit message (Collapse) | Author | Age | Files | Lines |
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This test just performs random operations on random eraseblocks.
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
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This test examines I/O speed of the flash device.
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
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A simple tests which reads whole MTD device one page at a time.
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
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This test checks that NAND pages read/write work fine.
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
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This test checks that OOB of a NAND MTD device works fine.
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
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