device_samsung_crespo.git - device/samsung/crespo

	Commit message (Collapse)	Author	Age	Files	Lines
*	Remove ANAVMID EEPROM values.	Martijn Coenen	2012-02-24	1	-2/+0
\| \| \| \| \| \| \| \| \|	These values are calibrated in the factory and should not be overwritten; they negatively affect both reader and ce performance. See the bug for more details. Bug: 5969862 Change-Id: I5c1a7ff1da0763891c0948e7cc0853e4bec15c82
*	Reduce NFC-DEP target timeout in ATR_RES to 8.	Martijn Coenen	2012-02-08	1	-2/+2
\| \| \| \| \| \| \| \|	This is actually required by [DIGITAL], see WTmax in Appendix A.10 in Digital 1.0 Bug: 5971998 Change-Id: If25e887d80e3cdfd48b112453b187c38f4ceeeaa
*	Update EEPROM for FW 109.12, and enable low power polling retry mechanism.	Nick Pelly	2011-11-07	1	-6/+8
\| \| \| \| \| \| \|	4 retries. Bug: 5515083 Change-Id: I9d2d0227e5280acc27f31dd14e539052a3e00268
*	NFC: HAL for crespo/crespo4g	Martijn Coenen	2011-11-04	2	-0/+157
	Change-Id: If29df4a0a9697d7066f9f21f5fbdc29d9042c387