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author | Stephen Lin <stephenwlin@gmail.com> | 2013-07-13 20:38:47 +0000 |
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committer | Stephen Lin <stephenwlin@gmail.com> | 2013-07-13 20:38:47 +0000 |
commit | b4dc0233c9f70e8cf946822811f233bb613a02e9 (patch) | |
tree | 6cb47482e15d250ae95e5c6c96abd2afb56f6fca /test/CodeGen/ARM/fast-isel.ll | |
parent | ae4e1a94e3fb7d1d2d0eec6eb7d04b74326c8453 (diff) | |
download | external_llvm-b4dc0233c9f70e8cf946822811f233bb613a02e9.zip external_llvm-b4dc0233c9f70e8cf946822811f233bb613a02e9.tar.gz external_llvm-b4dc0233c9f70e8cf946822811f233bb613a02e9.tar.bz2 |
Convert CodeGen/*/*.ll tests to use the new CHECK-LABEL for easier debugging. No functionality change and all tests pass after conversion.
This was done with the following sed invocation to catch label lines demarking function boundaries:
sed -i '' "s/^;\( *\)\([A-Z0-9_]*\):\( *\)test\([A-Za-z0-9_-]*\):\( *\)$/;\1\2-LABEL:\3test\4:\5/g" test/CodeGen/*/*.ll
which was written conservatively to avoid false positives rather than false negatives. I scanned through all the changes and everything looks correct.
git-svn-id: https://llvm.org/svn/llvm-project/llvm/trunk@186258 91177308-0d34-0410-b5e6-96231b3b80d8
Diffstat (limited to 'test/CodeGen/ARM/fast-isel.ll')
-rw-r--r-- | test/CodeGen/ARM/fast-isel.ll | 12 |
1 files changed, 6 insertions, 6 deletions
diff --git a/test/CodeGen/ARM/fast-isel.ll b/test/CodeGen/ARM/fast-isel.ll index fd846bd..682fa35 100644 --- a/test/CodeGen/ARM/fast-isel.ll +++ b/test/CodeGen/ARM/fast-isel.ll @@ -27,16 +27,16 @@ br label %if.end if.end: ; preds = %if.then, %entry ret void -; ARM: test1: +; ARM-LABEL: test1: ; ARM: tst r0, #1 -; THUMB: test1: +; THUMB-LABEL: test1: ; THUMB: tst.w r0, #1 } ; Check some simple operations with immediates define void @test2(i32 %tmp, i32* %ptr) nounwind { -; THUMB: test2: -; ARM: test2: +; THUMB-LABEL: test2: +; ARM-LABEL: test2: b1: %a = add i32 %tmp, 4096 @@ -64,8 +64,8 @@ b3: } define void @test3(i32 %tmp, i32* %ptr1, i16* %ptr2, i8* %ptr3) nounwind { -; THUMB: test3: -; ARM: test3: +; THUMB-LABEL: test3: +; ARM-LABEL: test3: bb1: %a1 = trunc i32 %tmp to i16 |